TTTC: RASDAT 2012 Call for Papers - Submission Deadline Oct 21st!

CALL FOR PAPERS

Scope -- Submissions -- Key Dates -- Additional Information -- Committees

Scope

Even as advances in CMOS technology come up against physical limits of material properties and lithography, raising many new challenges that must be overcome to ensure IC quality and reliability, there appears to be no obvious alternate technology that can replace End-of-Roadmap CMOS over the next decade. However, many reliability challenges from increasing defect rates, manufacturing variations, soft errors, wearout, etc. will need to be addressed by innovative new design and test methodologies if device scaling is to continue on track as per Moore’s Law to 10nm and beyond. The key objective of this annual workshop, planned to be held in conjunction with the International Conference on VLSI Design, is to provide an informal forum for vigorous creative discussion and debate of this area. The aim is to encourage the presentation and discussion of truly innovative and “out-of-the-box” ideas that may not yet have been fully developed for presentation at reviewed conferences to address these challenges. Additionally, the workshop invites embedded talks and tutorials on cutting edge topics related to reliability aware design of CMOS and hybrid nanotechnology systems.

Representative topics include, but are not limited to:

Design for test
Built-in self-test
ATPG and defect oriented test
Delay test
Low power test
Instruction-based self-test
On-line test methodology
Reliability of CMOS circuits
Self checker circuits
Self diagnosis methods

Fault tolerant micro-architecture
Self-healing system design
Energy and performance aware fault -tolerant micro-architectures
Device degradation and mitigation
System validation methodology
Secure system design
Design for reliability, dependability, and verifiability

Submissions

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Authors are invited to submit previously unpublished technical proposals. The proposals must be full papers not to exceed 6 pages. Each submission should include: title, full name and affiliation of all authors, a short abstract of 50 words, and 6 to 7 keywords. Also, identify a contact author and include a complete correspondence address, phone number, fax number, and e-mail address. Submit a copy of your proposal in PDF either online submission via workshop website http://www.serc.iisc.ernet.in/~viren/RASDAT12/

Submissions are due no later than October 21, 2011. Authors will be notified of the disposition of their presentation by November 15, 2011 Authors of accepted presentations must submit the final paper by December 1, 2011 for inclusion in the Workshop Proceedings, which will be provided to the attendees.

Key Dates

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Submission deadline: October 21, 2011
Notification of acceptance: November 15, 2011
Final copy deadline: December 1, 2011

Additional Information

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General Information

Adit Singh
Auburn University, Auburn, USA
E-mail: adsingh@auburn.edu
Tel: +1.334.644.1647
Fax: +1.334.844.1809

Virendra Singh
Indian Institute of Science, Bangalore, India
E-mail: viren@serc.iisc.ernet.in
Tel: +91.80.2293.3421
Fax: +91.80.2360.2648

Program Related Information

Rubin Parekhji
parekhji@ti.com

Erik Larsson
Erik.larsson@liu.se

Committees

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Organizing Committee

General Co-Chairs
Adit Singh (Auburn U., US)
Virendra Singh (IISc, IN)

General Vice Co-Chairs
Michiko Inoue (NAIST, JP)
Sreejit Chakravarty (LSI, US)

Program Co-Chairs
Erik Larsson (Linkoping U. SE)
Rubin Parekhji (TI, IN)

Program Vice Co-Chairs
Ilia Polian (Passau U., DE)
MS Gaur (MNIT, IN)

Organizing Committee Co-Chairs
Bhargab Bhattacharya (ISI, IN)
V. Kamakoti (IITM, IN)

Publication Chair
Vijay Laxmi (MNIT, IN)

Finance Co-Chair
Pradip Thaker (Beeceem, IN)
S. Ramakrishnan (WT, IN)

Publicity Chair
Susanta Chakravarty (BESU, IN)
Chia Yee Ooi (TUM, MY)

Local Arrangement Chair
TBD

Website Management Chair
Sushil Kabra (BSNL, IN)

Registration Chair
Jaynarayan Tudu (IISc, IN)
Arjun Chiluka (IISc, IN)

Steering Committee

K.K. Saluja (US) – Chair
J.A. Abraham (US)
V.D. Agrawal (US)
B. Al-Hashimi (UK)
B. Becker (DE)
A. Chatterjee (US)
H. Fujiwara (JP)
M. Fujita (JP)
E. Larsson (SE)
R. Parekhji (IN)
S.M. Reddy (US)
A.D. Singh (US)
V. Singh (IN)

Program Committee

TBD

For more information, visit us on the web at: http://www.serc.iisc.ernet.in/~viren/RASDAT12/

The 3rd IEEE International Workshop on Reliability Aware System Design and Test (RASDAT 2012) is sponsored by the Institute of Electrical and Electronics Engineers (IEEE) Computer Society's Test Technology Technical Council (TTTC).